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Low-frequency noise and radiation response of buried oxides in SOI nMOS transistors. Xiong, HD; Fleetwood, DM; Schwank, JR, IEE PROCEEDINGS-CIRCUITS DEVICES AND SYSTEMS 2004, 151, 118-124 View Abstract

Quantitation and kinetics of CD51 surface receptor expression: Implications for targeted delivery. Smith, RA; Giorgio, TD, ANNALS OF BIOMEDICAL ENGINEERING 2004, 32, 635-644 View Abstract

CVD diamond photoconductive devices. Choi, BK; Kang, WP; Davidson, JL; Howell, M; Schrimpf, RD; Fleetwood, DM, DIAMOND AND RELATED MATERIALS 2004, 13, 785-790 View Abstract

Diamond microelectronic gas sensor for detection of benzene and toluene. Gurbuz, Y; Kang, WP; Davidson, JL; Kerns, DV, SENSORS AND ACTUATORS B-CHEMICAL 2004, 99, 207-215 View Abstract

A microfluidic device to confine a single cardiac myocyte in a sub-nanoliter volume on planar microelectrodes for extracellular potential recordings. Werdich, AA; Lima, EA; Ivanov, B; Ges, I; Anderson, ME; Wikswo, JP; Baudenbacher, FJ, LAB ON A CHIP 2004, 4, 357-362 View Abstract

Experimental characterization of anode heating due to electron field emission. Harris, CT; Walker, DG; Fisher, TS; Hofmeister, WH, MICROSCALE THERMOPHYSICAL ENGINEERING 2004, 8, 101-109 View Abstract

Amine-terminated dendrimers as biomimetic templates for silica nanosphere formation. Knecht, MR; Wright, DW, LANGMUIR 2004, 20, 4728-4732 View Abstract

Phase coexistence in polydisperse charged hard-sphere fluids: Mean spherical approximation. Kalyuzhnyi, YV; Kahl, G; Cummings, PT, JOURNAL OF CHEMICAL PHYSICS 2004, 120, 10133-10145 View Abstract

Epidermal growth factor upregulates matrix metalloproteinase-7 expression through activation of PEA3 transcription factors. Lynch, CC; Crawford, HC; Matrisian, LM; McDonnell, S, INTERNATIONAL JOURNAL OF ONCOLOGY 2004, 24, 1565-1572 View Abstract

Influence of total-dose radiation on the electrical characteristics of SOI MOSFETs. Felix, JA; Schwank, JR; Cirba, CR; Schrimpf, RD; Shaneyfelt, MR; Fleetwood, DM; Dodd, PE, MICROELECTRONIC ENGINEERING 2004, 72, 332-341 View Abstract

Generation of metastable electron traps in the near interfacial region of SOI buried oxides by ion implantation and their effect on device properties. Schwank, JR; Fleetwood, DM; Xiong, HD; Shaneyfelt, MR; Draper, BL, MICROELECTRONIC ENGINEERING 2004, 72, 362-366 View Abstract

The energy dependence of proton-induced degradation in AlGaN/GaN high electron mobility transistors. Hu, XW; Choi, BK; Barnaby, HJ; Fleetwood, DM; Schrimpf, RD; Lee, SC; Shojah-Ardalan, S; Wilkins, R; Mishra, UK; Dettmer, RW, IEEE TRANSACTIONS ON NUCLEAR SCIENCE 2004, 51, 293-297 View Abstract

Foundations of Molecular Modelling and Simulation - FOMMS 2003 - Keystone Resort, Colorado, USA - 6-11 July 2003. Cummings, PT; Jackson, G, MOLECULAR PHYSICS 2004, 102, 137-137

Simulated water adsorption isotherms in carbon nanopores. Striolo, A; Gubbins, KE; Chialvo, AA; Cummings, PT, MOLECULAR PHYSICS 2004, 102, 243-251 View Abstract

Cell-based screening: a high throughput flow cytometry platform for identification of cell-specific targeting molecules. Smith, RA; Giorgio, TD, COMBINATORIAL CHEMISTRY & HIGH THROUGHPUT SCREENING 2004, 7, 141-151 View Abstract

Effects of radiation and charge trapping on the reliability of high-kappa gate dielectrics. Felix, JA; Schwank, JR; Fleetwood, DM; Shaneyfelt, MR; Gusev, EP, MICROELECTRONICS RELIABILITY 2004, 44, 563-575 View Abstract

Review - Proteases, extracellular matrix, and cancer - A workshop of the path B study section. DeClerck, YA; Mercurio, AM; Stack, MS; Chapman, HA; Zutter, MM; Muschel, RJ; Raz, A; Matrisian, LM; Sloane, BF; Noel, A; Hendrix, MJ; Coussens, L; Padarathsingh, M, AMERICAN JOURNAL OF PATHOLOGY 2004, 164, 1131-1139 View Abstract

Dopants adsorbed as single atoms prevent degradation of catalysts. Wang, SW; Borisevich, AY; Rashkeev, SN; Glazoff, MV; Sohlberg, K; Pennycook, SJ; Pantelides, ST, NATURE MATERIALS 2004, 3, 143-146 View Abstract

Fluorinated polymer films from acylation of ATRP surface-initiated poly(hydroxyethyl methacrylate). Brantley, EL; Jennings, GK, MACROMOLECULES 2004, 37, 1476-1483 View Abstract

Charge separation techniques for irradiated pseudo-MOS SOI transistors. Jun, B; Fleetwood, DM; Schrimpf, RD; Zhou, X; Montes, EJ; Cristoloveanu, S, IEEE TRANSACTIONS ON NUCLEAR SCIENCE 2003, 50, 1891-1895 View Abstract

Statistical modeling of radiation-induced proton transport in silicon: Deactivation of dopant acceptors in bipolar devices. Rashkeev, SN; Fleetwood, DA; Schrimpf, RD; Pantelides, ST, IEEE TRANSACTIONS ON NUCLEAR SCIENCE 2003, 50, 1896-1900 View Abstract

Total-dose and single-event effects in DC/DC converter control circuitry. Adell, PC; Schrimpf, RD; Holman, WI; Boch, J; Stacey, J; Ribero, P; Stenberg, A; Galloway, KF, IEEE TRANSACTIONS ON NUCLEAR SCIENCE 2003, 50, 1867-1872 View Abstract

Contactless ultra-fast laser probing of radiation-induced leakage current in ultra-thin oxides. Pasternak, R; Chatterjee, A; Shirokaya, YV; Choi, BK; Marka, Z; Miller, JK; Albridge, RG; Rashkeev, SN; Pantelides, ST; Schrimpf, RD; Fleetwood, DM; Tolk, NH, IEEE TRANSACTIONS ON NUCLEAR SCIENCE 2003, 50, 1929-1933 View Abstract

Effects of 2 MeV proton irradiation on operating wavelength and leakage current of vertical cavity surface emitting lasers. Kalavagunta, A; Choi, B; Neifeld, MA; Schrimpf, R, IEEE TRANSACTIONS ON NUCLEAR SCIENCE 2003, 50, 1982-1990 View Abstract

Electrical, spectral, and chemical properties of 1.8 MeV proton irradiated AlGaN/GaN HEMT structures as a function of proton fluence. White, BD; Bataiev, M; Goss, SH; Hu, X; Karmarkar, A; Fleetwood, DM; Schrimpf, RD; Schaff, WJ; Brillson, LJ, IEEE TRANSACTIONS ON NUCLEAR SCIENCE 2003, 50, 1934-1941 View Abstract

Publications 3901-3925 of 4326 total