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VINSE - Vanderbilt Institute of Nanoscale Science and Engineering

VINSE - Vanderbilt Institute of Nanoscale Science and Engineering
  2. Facilities
  3. Instruments
  4. Atomic Force Microscope (AFM) - Bruker Dimenson Icon

Atomic Force Microscope (AFM) - Bruker Dimenson Icon

Overview

Contact: Dmitry Koktysh
ESB 023 - Advanced Imaging
615-322-6299

Fee Structure

Get Access - Vanderbilt
Get Access - Non-Vanderbilt

The Dimension Icon® Atomic Force Microscope brings new levels of performance, functionality, and AFM accessibility to nanoscale researchers in science and industry. The culmination of decades of large-sample AFM technology, the system has been designed from top to bottom to deliver revolutionary low drift and low noise that allows users to achieve artifact-free images in minutes instead of hours. The Icon is also equipped with a heater controller to be used in conjunction with the fluid cell kit. The cell kit allows real-time observations of samples under native conditions while providing sample heating and temperature control when liquids are being studied. Proprietary ScanAsyst® automatic image optimization technology enables easier, faster, and more consistent results, regardless of user skill level. The Icon’s uncommon ease of use, ultimate performance, exceptional productivity, and superior versatility make it an ideal choice for practically every AFM application.

Capabilities

  • X-Y scan range: 90µm x 90µm typical
  • Z range: 10?m typical in imaging and force curve modes
  • Sample size/holder: 210mm vacuum chuck for samples, less than 210mm, less than 5mm thick
  • Vertical noise floor: less than 30pm
  • X-Y position noise: less than 0.15
  • Motorized position stage (X-Y axis): 180mm × 150mm inspectable area
  • Microscope optics: 5-megapixel digital camera
  • Digital zoom and motorized focus
  • Controller NanoScope V
  • Vibration isolation: Integrated, pneumatic
  • Acoustic isolation

AFM Modes

  • Contact Mode
  • Tapping Mode
  • PhaseImaging
  • ScanAsyst/PeakForce mode
  • PeakForce QNM
  • Force Spectroscopy/Force Curves
  • Force Volume++
  • Piezo Response Force Microscopy
  • Lateral Force Microscopy (LFM)
  • Magnetic Force Microscopy (MFM)
  • Electric Force Microscopy (EFM)
  • Kelvin Probe Force Microscopy (KPFM-AM)/Surface Potential
  • Scanning Tunneling Microscopy (STM)
  • Torsional Resonance Mode (TRmode)
  • Scanning Thermal Microscopy (SThM)
  • Cantilever Holder for Scanning in Fluid
  • Fluid and Gas Flow Cell with 60 °C heater