Skip to main content

Osiris Transmission Electron Microscope (TEM)

TEM FEI Tecnai Osiris

Description:

The FEI Tecnai Osiris is a modern analytical 80-200 kV scanning/transmission electron microscope (S/TEM). It is designed to deliver rapid access to high resolution TEM and STEM imaging paired with an industry-leading energy dispersive x-ray spectroscopy (EDS) SuperX detection system. In conjunction with the available tomography holder, 3D chemical maps at the nanoscale are possible. Further, in-situ heating abilities are available with the use of the Protochips Aduro platform.


HRTEM and HRSTEM of CdSe Nanorods


STEM-EDS of a CdSe/CdS core/shell nanocrystal acquired with a 0.3 nm probe showing the location of the CdSe core