Electron microscopy is essential for characterizing materials and biological specimens at the nanoscale. While scanning electron microscopy (SEM) and transmission electron microscopy (TEM) both rely on electron beams to reveal structural information, they do so through fundamentally different imaging mechanisms. To interpret data accurately, users must understand how these images are formed, even with today’s increasingly user-friendly instrument software.
This two-day short course combines accessible lectures with hands-on demonstrations on the Zeiss Merlin SEM and the Tecnai Osiris advanced analytical TEM/STEM. Participants will see how the microscope can be used effectively to get the most meaningful information and produce the highest-quality images.
Topics include secondary vs. backscattered electron imaging, bright-field and dark-field TEM, STEM operation, and analytical SEM/STEM techniques using energy-dispersive spectroscopy.
Attendance is open to everyone and is not limited to Vanderbilt personnel or VINSE users. Please note that space is limited to 10 participants, and early registration is strongly encouraged to secure your spot.
$75 Vanderbilt Users; $75 External Academic and Non-Profit Users; $200 Industry and For-Profit Users