VINSE Short Course

Electron microscopy is essential for characterizing materials and biological specimens at the nanoscale. While scanning electron microscopy (SEM) and transmission electron microscopy (TEM) both rely on electron beams to reveal structural information, they do so through fundamentally different imaging mechanisms. To interpret data accurately, users must understand how these images… Read More

Microelectronic devices are embedded in an expanding range of everyday technologies—from phones and cars to wearables and medical products. As these devices continue to shrink in size and grow in performance, energy efficiency, and functionality, understanding the fundamental processes behind their fabrication and testing is increasingly important. This course… Read More

Microfluidic devices play a key role in controlling and analyzing fluid flow at the micrometer scale, with applications ranging from portable point-of-care sensors and particle/cell sorting into nanoparticle synthesis and organ-on-chip systems. This short course offers an introduction to the fabrication and testing of microfluidic devices through a combination of… Read More

Atomic force microscopy (AFM) is a powerful multi-parametric technique for 3D topographical imaging and for probing nano-mechanical, nano-electrical, and nano-magnetic surface properties. This short course will provide participants with a solid foundation in AFM theory and practical guidance for operating a wide range of AFM modes, including imaging in… Read More

Registration is now open for the VINSE Electron Microscopy short course, taking place June 9-10. This course offers the opportunity to advance knowledge and skill with characterizing material and biological specimens at the nanoscale. Participation is open to all, not just Vanderbilt personnel or VINSE users. However, space is… Read More