Electron Microscopy

Electron microscopy is essential for characterizing materials and biological specimens at the nanoscale. While scanning electron microscopy (SEM) and transmission electron microscopy (TEM) both rely on electron beams to reveal structural information, they do so through fundamentally different imaging mechanisms. To interpret data accurately, users must understand how these images… Read More

Registration is now open for the VINSE Electron Microscopy short course, taking place June 9-10. This course offers the opportunity to advance knowledge and skill with characterizing material and biological specimens at the nanoscale. Participation is open to all, not just Vanderbilt personnel or VINSE users. However, space is… Read More