Atomic force microscopy (AFM) is a powerful multi-parametric technique for 3D topographical imaging and for probing nano-mechanical, nano-electrical, and nano-magnetic surface properties. This short course will provide participants with a solid foundation in AFM theory and practical guidance for operating a wide range of AFM modes, including imaging in liquid environments.
Through lectures and hands-on demonstrations, attendees will explore case studies spanning semiconductors, 2D materials, and biomaterials. The course will also cover essential sample preparation methods and strategies for selecting appropriate AFM probes. In addition, participants will learn about AFM’s nanomanipulation and nanolithography capabilities, including both point-and-click and recipe-driven “writing” techniques performed in air and liquid.
Attendance is open to everyone and is not limited to Vanderbilt personnel or VINSE users. Please note that the course is limited to 10 participants, and early registration is strongly encouraged to secure your spot.
$50 Vanderbilt Users; $50 External Academic and Non-Profit Users; $150 Industry and For-Profit Users