Atomic Force Microscopy

Atomic force microscopy (AFM) is a powerful multi-parametric technique for 3D topographical imaging and for probing nano-mechanical, nano-electrical, and nano-magnetic surface properties. This short course will provide participants with a solid foundation in AFM theory and practical guidance for operating a wide range of AFM modes, including imaging in… Read More

VINSE Atomic Force Microscopy (AFM) Short Course is scheduled for June 12-13. This hands-on course is designed to enhance participants’ understanding of AFM theory while providing practical insights and operational tips on a variety of AFM techniques. Attendance is open to everyone and is not limited to Vanderbilt personnel or VINSE… Read More