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Radiation Effects in Electronics

Website: http://eecs.vanderbilt.edu/research/rer/

As electronics become smaller, they become increasingly more sensitive to environmental radiation. Advanced memories may represent bits of information with only a few hundred electrons and when an energetic particle passes through the material it may generate far more charge carriers. These radiation-generated carriers compete with the carriers that represent the data, resulting in soft errors. In the Radiation Effects and Reliability Group, we work to understand the mechanisms of these effects through experiments and simulations, using the results to develop more reliable electronics. The research extends from atomic-scale interactions of radiation with matter, through device physics, and system response. This research area is associated with Vanderbilt's Institute for Space and Defense Electronics, which is the largest university-based program dealing with the effects of radiation on electronics. 

 
Vanderbilt University