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Schmidt, Benjamin W
Director of Laboratories

Research Information

Research interests include:  Thin film characterization, optical-limiting materials, microfabrication process technology


Selected Publications

Carbon incorporation in chemical vapor deposited aluminum oxide films. Schmidt, BW; Rogers, BR; Gren, CK; Hanusa, TP, THIN SOLID FILMS, 518, 3658-3663 , (2010)

Deposition of alumina from dimethylaluminum isopropoxide. Schmidt, BW; Rogers, BR; Sweet, WJ; Gren, CK; Hanusa, TP, JOURNAL OF THE EUROPEAN CERAMIC SOCIETY, 30, 2301-2304 , (2010)

Facile route to SnS nanocrystals and their characterization. Koktysh, DS; McBride, JR; Geil, RD; Schmidt, BW; Rogers, BR; Rosenthal, SJ, MATERIALS SCIENCE AND ENGINEERING B-ADVANCED FUNCTIONAL SOLID-STATE MATERIALS, 170, 117-122 , (2010)

Metal-organic chemical vapor deposition of aluminum oxide thin films via pyrolysis of dimethylaluminum isopropoxide. Schmidt, BW; Sweet, WJ; Bierschenk, EJ; Gren, CK; Hanusa, TP; Rogers, BR, JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 28, 238-243 , (2010)

Temperature Stress Response of Germanium MOS Capacitors with HfO2/HfSiON Gate Dielectric. Arora, R; Fleetwood, DM; Schrimpf, RD; Galloway, KF; Schmidt, BW; Rogers, BR; Chung KB; Lucovsky, G, ECS Transactions, 19, 803-814 , (2009)


Phone: 615-343-6721
Email: ben.schmidt@vanderbilt.edu

 
Vanderbilt University