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Pasternak, Robert
Ph.D. in Physics and Astronomy, December 2005

Research Information

Ph.D. in Physics and Astronomy, December 2005

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Ph.D. Dissertation
Charge Carrier Dynamics in Si/SiO2 Studied by Electric Field Induced Second-Harmonic Generation

Ph.D. Advisor
Norman Tolk, Physics

Ph.D. Committee
Royal Albridge
Steven Csorna
Jim Davidson
Ronald Schrimpf

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Selected Publications

Temperature-dependent second- and third-order optical nonlinear susceptibilities at the Si/SiO2 interface. Lu, X; Pasternak, R; Park, H; Qi, JB; Tolk, NH; Chatterjee, A; Schrimpf, RD; Fleetwood, DM, PHYSICAL REVIEW B, 78, 155311 , (2008)

Oxide interface studies using second harmonic generation. Tolk, NH; Alles, ML; Pasternak, R; Lu, X; Schrimpf, RD; Fleetwood, DM; Dolan, RP; Standley, RW, MICROELECTRONIC ENGINEERING, 84, 2089-2092 , (2007)

Second harmonic generation for noninvasive metrology of silicon-on-insulator wafers. Alles, ML; Pasternak, R; Lu, X; Tolk, NH; Schrimpf, RD; Fleetwood, DM; Dolan, RP; Standley, RW, IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, 20, 107-113 , (2007)

Studies of charge carrier trapping and recombination processes in Si/SiO2/MgO structures using second-harmonic generation. White, YV; Lu, X; Pasternak, R; Tolk, NH; Chatterjee, A; Schrimpf, RD; Fleetwood, DM; Ueda, A; Mu, R, APPLIED PHYSICS LETTERS, 88, 062102 , (2006)

Charge trapping in irradiated SOI wafers measured by second harmonic generation. Jun, B; Schrimpf, RD; Fleetwood, DA; White, YV; Pasternak, R; Rashkeev, SN; Brunier, F; Bresson, N; Fouillat, M; Cristoloveanu, S; Tolk, NH, IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 51, 3231-3237 , (2004)

Band offsets measured by internal photoemission-induced second-harmonic generation. Marka, Z; Pasternak, R; Rashkeev, SN; Jiang, Y; Pantelides, ST; Tolk, NH; Roy, PK; Kozub, J, PHYSICAL REVIEW B, 67, 045302 , (2003)

Contactless ultra-fast laser probing of radiation-induced leakage current in ultra-thin oxides. Pasternak, R; Chatterjee, A; Shirokaya, YV; Choi, BK; Marka, Z; Miller, JK; Albridge, RG; Rashkeev, SN; Pantelides, ST; Schrimpf, RD; Fleetwood, DM; Tolk, NH, IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 50, 1929-1933 , (2003)

Laser detection of radiation enhanced electron transport in ultra-thin oxides. Pasternak, R; Shirokaya, YV; Marka, Z; Miller, JK; Rashkeev, SN; Pantelides, ST; Tolk, NH; Choi, BK; Schrimpf, RD; Fleetwood, DM, NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 514, 150-155 , (2003)

Spin/carrier dynamics at semiconductor interfaces using intense, tunable, ultra-fast lasers. Jiang, Y; Pasternak, R; Marka, Z; Shirokaya, YV; Miller, JK; Rashkeev, SN; Glinka, YD; Perakis, IE; Roy, PK; Kozub, J; Choi, BK; Fleetwood, DM; Schrimpf, RD; Liu, X; Sasaki, Y; Furdyna, JK; Tolk, NH, PHYSICA STATUS SOLIDI B-BASIC RESEARCH, 240, 490-499 , (2003)

Two-color optical technique for characterization of x-ray radiation-enhanced electron transport in SiO2. Marka, Z; Pasternak, R; Albridge, RG; Rashkeev, SN; Pantelides, ST; Tolk, NH; Choi, BK; Fleetwood, DM; Schrimpf, RD, JOURNAL OF APPLIED PHYSICS, 93, 1865-1870 , (2003)

 
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