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Geil, Robert
Ph.D. in Chemical Engineering, August 2005

Research Information

Ph.D. in Chemical Engineering, August 2005

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Ph.D. Dissertation
Analysis of High-K Dielectric Films with Time-of-Flight Medium Energy Backscattering

Ph.D. Advisor
Bridget Rogers, Chemical Engineering

Committee Members
Peter Cummings, Chemical Engineering
Kenneth Debelak, Chemical Engineering
Kane Jennings, Chemical Engineering
Robert Weller, Electrical Engineering

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Selected Publications

Facile route to SnS nanocrystals and their characterization. Koktysh, DS; McBride, JR; Geil, RD; Schmidt, BW; Rogers, BR; Rosenthal, SJ, MATERIALS SCIENCE AND ENGINEERING B-ADVANCED FUNCTIONAL SOLID-STATE MATERIALS, 170, 117-122 , (2010)

Method for measuring solvent permeation through polymer film on porous dielectric films. Geil, RD; Senkevich, JJ; Rogers, BR, JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 27, 1825-1828 , (2009)

Dual process dielectric formation for decoupling capacitors on flexible substrates. Raghuveer, R; Burkett, SL; Schaper, LW; Ulrich, RK; Rogers, BR; Geil, RD, IEEE TRANSACTIONS ON COMPONENTS AND PACKAGING TECHNOLOGIES, 30, 579-584 , (2007)

Effects of multiple scattering and surface roughness on medium energy backscattering spectra. Geil, RD; Mendenhall, M; Weller, RA; Rogers, BR, NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 256(2), 631-637 , (2007)

Copper electroplating to fill blind vias for three-dimensional integration. Spiesshoefer, S; Patel, J; Lam, T; Cai, L; Polamreddy, S; Figueroa, RF; Burkett, SL; Schaper, L; Geil, R; Rogers, B, JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 24, 1277-1282 , (2006)

Proton-irradiation effects on AlGaN/AlN/GaN high electron mobility transistors. Hu, XW; Karmarkar, AP; Jun, B; Fleetwood, DM; Schrimpf, RD; Geil, RD; Weller, RA; White, BD; Bataiev, M; Brillson, LJ; Mishra, UK, IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 50, 1791-1796 , (2003)

 
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