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Geil, Robert
Ph.D. in Chemical Engineering, August 2005

Research Information

Ph.D. in Chemical Engineering, August 2005


Ph.D. Dissertation
Analysis of High-K Dielectric Films with Time-of-Flight Medium Energy Backscattering

Ph.D. Advisor
Bridget Rogers, Chemical Engineering

Committee Members
Peter Cummings, Chemical Engineering
Kenneth Debelak, Chemical Engineering
Kane Jennings, Chemical Engineering
Robert Weller, Electrical Engineering


Selected Publications

Facile route to SnS nanocrystals and their characterization. Koktysh, DS; McBride, JR; Geil, RD; Schmidt, BW; Rogers, BR; Rosenthal, SJ, MATERIALS SCIENCE AND ENGINEERING B-ADVANCED FUNCTIONAL SOLID-STATE MATERIALS, 170, 117-122 , (2010)

Method for measuring solvent permeation through polymer film on porous dielectric films. Geil, RD; Senkevich, JJ; Rogers, BR, JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 27, 1825-1828 , (2009)

Dual process dielectric formation for decoupling capacitors on flexible substrates. Raghuveer, R; Burkett, SL; Schaper, LW; Ulrich, RK; Rogers, BR; Geil, RD, IEEE TRANSACTIONS ON COMPONENTS AND PACKAGING TECHNOLOGIES, 30, 579-584 , (2007)

Effects of multiple scattering and surface roughness on medium energy backscattering spectra. Geil, RD; Mendenhall, M; Weller, RA; Rogers, BR, NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 256(2), 631-637 , (2007)

Copper electroplating to fill blind vias for three-dimensional integration. Spiesshoefer, S; Patel, J; Lam, T; Cai, L; Polamreddy, S; Figueroa, RF; Burkett, SL; Schaper, L; Geil, R; Rogers, B, JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 24, 1277-1282 , (2006)

Proton-irradiation effects on AlGaN/AlN/GaN high electron mobility transistors. Hu, XW; Karmarkar, AP; Jun, B; Fleetwood, DM; Schrimpf, RD; Geil, RD; Weller, RA; White, BD; Bataiev, M; Brillson, LJ; Mishra, UK, IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 50, 1791-1796 , (2003)

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