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Ramachandran, Vishwa
Electrical Engineering

Research Information

Graduate Student, Electrical Engineering

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Research Area
Radiation effects on microelectronics

Ph.D. Thesis Advisor
Ronald Schrimpf

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Selected Publications

Temperature Dependence of Digital Single-Event Transients in Bulk and Fully-Depleted SOI Technologies. Gadlage, MJ; Ahlbin, JR; Ramachandran, V; Gouker, P; Dinkins, CA; Bhuva, BL; Narasimham, B; Schrimpf, RD; McCurdy, MW; Alles, ML; Reed, RA; Mendenhall, MH; Massengill, LW; Shuler, RL; McMorrow, D, IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 56, 3115-3121 , (2009)


Email: vishwa.ramachandran@vanderbilt.edu

 
Vanderbilt University