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Amusan, Oluwole
Ph.D. in Electrical Engineering, Spring 2009

Research Information

Ph.D. in Biomedical Engineering, Spring 2009


Ph.D. Disseratation
Effects of Single Event Induced Charge Sharing in Sub-100 nm Bulk CMOS Technologies

Ph.D. Committee
Lloyd Massengill, Chair
Michael Alles
Bharat Bhuva
Mark Ellingham
Arthur Witulski


Selected Publications

Use of a Contacted Buried n(+) Layer for Single Event Mitigation in 90 nm CMOS. DasGupta, S; Amusan, OA; Alles, ML; Witulski, AF; Massengill, LW; Bhuva, BL; Schrimpf, RD; Reed, RA, IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 56, 2008-2013 , (2009)

Extended SET Pulses in Sequential Circuits Leading to Increased SE Vulnerability. Narasimham, B; Amusan, OA; Bhuva, BL; Schrimpf, RD; Holman, WT, IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 55, 3077-3081 , (2008)

Characterization of digital single event transient pulse-widths in 130-nm and 90-nm CMOS technologies. Narasimham, B; Bhuva, BL; Schrimpf, RD; Massengill, LW; Gadlage, MJ; Amusan, OA; Holman, WT; Witulski, AF; Robinson, WH; Black, JD; Benedetto, JM; Eaton, PH, IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 54, 2506-2511 , (2007)

Effect of well and substrate potential modulation on single event pulse shape in deep submicron CMOS. DasGupta, S; Witulski, AF; Bhuva, BL; Alles, ML; Reed, RA; Amusan, OA; Ahlbin, JR; Schrimpf, RD; Massengill, LW, IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 54, 2407-2412 , (2007)

Vanderbilt University