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Tolk, Norman H.
Professor of Physics

Research Information

Research interests include: experimental physics, dynamics of electronic processes at surfaces and interface, spintronics, atomic collision physics, quantum mechanical phase interference effects, and linear and nonlinear laser interactions with surface and interfaces.


Selected Publications

Reconfiguration and dissociation of bonded hydrogen in silicon by energetic ions. Rao, SVSN; Dixit, SK; Lupke, G; Tolk, NH; Feldman, LC, PHYSICAL REVIEW B, 83, 045204 , (2011)

Boron induced charge traps near the interface of Si/SiO2 probed by second harmonic generation. Park, H; Qi, JB; Xu, Y; Varga, K; Weiss, SM; Rogers, BR; Lupke, G; Tolk, N, PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS, 247, 1997-2001 , (2010)

Giant Enhancement of Hydrogen Transport in Rutile TiO2 at Low Temperatures. Spahr, EJ; Wen, L; Stavola, M; Boatner, LA; Feldman, LC; Tolk, NH; Lupke, G, PHYSICAL REVIEW LETTERS, 104, 205901 , (2010)

Mechanical and electronic properties of ferromagnetic Ga1-xMnxAs using ultrafast coherent acoustic phonons. Qi, J; Yan, JA; Park, H; Steigerwald, A; Xu, Y; Gilbert, SN; Liu, X; Furdyna, JK; Pantelides, ST; Tolk, N, PHYSICAL REVIEW B, 81, 115208 , (2010)

Photon energy threshold for filling boron induced charge traps in SiO2 near the Si/SiO2 interface using second harmonic generation. Park, H; Xu, Y; Varga, K; Qi, JB; Feldman, LC; Lupke, G; Tolk, N, APPLIED PHYSICS LETTERS, 97, 202105 , (2010)

Ultrafast carrier and phonon dynamics in Bi2Se3 crystals. Qi, J; Chen, X; Yu, W; Cadden-Zimansky, P; Smirnov, D; Tolk, NH; Miotkowski, I; Cao, H; Chen, YP; Wu, Y; Qiao, S; Jiang, Z, APPLIED PHYSICS LETTERS, 97, 182102 , (2010)

Characterization of boron charge traps at the interface of Si/SiO2 using second harmonic generation. Park, H; Qi, J; Xu, Y; Varga, K; Weiss, SM; Rogers, BR; Lupke, G; Tolk, N, APPLIED PHYSICS LETTERS, 95, 062102 , (2009)

Fe/NiO(100) and Fe/MgO(100) interfaces studied by X-ray absorption spectroscopy and non-linear Kerr effect. Colonna, S; Cricenti, A; Luches, P; Valeri, S; Boscherini, F; Qi, J; Xu, Y; Tolk, N, SUPERLATTICES AND MICROSTRUCTURES, 46, 107-113 , (2009)

Proton Tunneling: A Decay Channel of the O-H Stretch Mode in KTaO3. Spahr, EJ; Wen, L; Stavola, M; Boatner, LA; Feldman, LC; Tolk, NH; Lupke, G, PHYSICAL REVIEW LETTERS, 102, 075506 , (2009)

Semiconductor point defect concentration profiles measured using coherent acoustic phonon waves. Steigerwald, A; Xu, Y; Qi, J; Gregory, J; Liu, X; Furdyna, JK; Varga, K; Hmelo, AB; Lupke, G; Feldman, LC; Tolk, N, APPLIED PHYSICS LETTERS, 94, 111910 , (2009)

Ultrafast laser-induced coherent spin dynamics in ferromagnetic Ga1-xMnxAs/GaAs structures. Qi, J; Xu, Y; Steigerwald, A; Liu, X; Furdyna, JK; Perakis, IE; Tolk, NH, PHYSICAL REVIEW B, 79, 085304 , (2009)

Electro-optic nature of ultrafast pump-probe reflectivity response from multilayer semiconductor heterostructures. Glinka, YD; Tolk, NH; Liu, X; Sasaki, Y; Furdyna, JK, JOURNAL OF APPLIED PHYSICS, 103, 043708 , (2008)

Hot-phonon-assisted absorption at semiconductor heterointerfaces monitored by pump-probe second-harmonic generation. Glinka, YD; Tolk, NH; Liu, X; Sasaki, Y; Furdyna, JK, PHYSICAL REVIEW B, 77, 113310 , (2008)

Infrared Scanning Near-Field Optical Microscopy Below the Diffraction Limit. Sanghera, JS; Aggarwal, ID; Cricenti, A; Generosi, R; Luce, M; Perfetti, P; Margaritondo, G; Tolk, NH; Piston, D, IEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICS, 14, 1343-1352 , (2008)

Infrared scanning near-field optical microscopy investigates order and clusters in model membranes. Generosi, J; Margaritondo, G; Sanghera, JS; Aggarwal, ID; Tolk, NH; Piston, DW; Castellano, AC; Cricenti, A, JOURNAL OF MICROSCOPY-OXFORD, 229, 259-263 , (2008)

Interaction of high-power infrared radiation with germanium. Seo, D; Feldman, LC; Tolk, NH; Cohen, PI, PROCEEDINGS - SPIE, 713216, , (2008)

Kinetics of a collagen-like polypeptide fragmentation after mid-IR free-electron laser ablation. Zavalin, A; Hachey, DL; Sundaramoorthy, M; Banerjee, S; Morgan, S; Feldman, L; Tolk, N; Piston, DW, BIOPHYSICAL JOURNAL, 95, 1371-1381 , (2008)

Low-frequency electromagnetic field effects on functional groups in human skin keratinocytes cells revealed by IR-SNOM. Cricenti, A; Generosi, R; Luce, M; Perfetti, P; Sanghera, JS; Aggarwa, ID; Tolk, NH; Vobornik, D; Margaritondo, G; Piston, DW; Manni, V; Grimaldi, S; Lisi, A; Rieti, S, JOURNAL OF MICROSCOPY-OXFORD, 229, 551-554 , (2008)

Photobleaching-free infrared near-field microscopy localizes molecules in neurons. Generosi, J; Margaritondo, G; Kropf, M; Hirling, H; Catsicas, S; Johnsson, K; Tolk, NH; Piston, DW; Cricenti, A, JOURNAL OF APPLIED PHYSICS, 104, 106102 , (2008)

Temperature-dependent second- and third-order optical nonlinear susceptibilities at the Si/SiO2 interface. Lu, X; Pasternak, R; Park, H; Qi, JB; Tolk, NH; Chatterjee, A; Schrimpf, RD; Fleetwood, DM, PHYSICAL REVIEW B, 78, 155311 , (2008)

Coherent magnetization precession in GaMnAs induced by ultrafast optical excitation. Qi, J; Xu, Y; Tolk, NH; Liu, X; Furdyna, JK; Perakis, IE, APPLIED PHYSICS LETTERS, 91, 112506 , (2007)

Effect of energetic ions on the stability of bond-center hydrogen in silicon. Rao, SVSN; Dixit, SK; Lupke, G; Tolk, NH; Feldman, LC, PHYSICAL REVIEW B, 75, 235202 , (2007)

Ferromagnetic-antiferromagnetic Fe/NiO (100) interface studied by non-linear Kerr effect. Colonna, S; Ronci, F; Cricenti, A; Luches, P; Valeri, S; Qi, J; Xu, Y; Miller, JK; Tolk, N, SURFACE SCIENCE, 601, 4362-4365 , (2007)

Infrared scanning near-field optical microscopy observation of low-frequency electromagnetic field effects on functional groups in eukaryotic cells. Cricenti, A; Generosi, R; Luce, M; Ronci, F; Perfetti, P; Vobornik, D; Margaritondo, G; Sanghera, JS; Aggarwal, ID; Tolk, NH; Piston, DW; Grimaldi, S; Lisi, A; Rieti, S, APPLIED PHYSICS LETTERS, 90, 033902 , (2007)

Oxide interface studies using second harmonic generation. Tolk, NH; Alles, ML; Pasternak, R; Lu, X; Schrimpf, RD; Fleetwood, DM; Dolan, RP; Standley, RW, MICROELECTRONIC ENGINEERING, 84, 2089-2092 , (2007)

Second harmonic generation for noninvasive metrology of silicon-on-insulator wafers. Alles, ML; Pasternak, R; Lu, X; Tolk, NH; Schrimpf, RD; Fleetwood, DM; Dolan, RP; Standley, RW, IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, 20, 107-113 , (2007)

Spatially resolved pump-probe second harmonic generation study of multilayer semiconductor heterostructures. Glinka, YD; Tolk, NH; Liu, X; Sasaki, Y; Furdyna, JK, APPLIED PHYSICS LETTERS, 91, 231104 , (2007)

Desorption of H from Si(111) by resonant excitation of the Si-H vibrational stretch mode. Liu, ZH; Feldman, LC; Tolk, NH; Zhang, ZY; Cohen, PI, SCIENCE, 312, 1024-1026 , (2006)

Infrared laser ablation of glassy As2Se3. Hari, P; Adair, J; Tolk, N; Sanghera, J; Aggarwal, I, JOURNAL OF NON-CRYSTALLINE SOLIDS, 352, 2430-2433 , (2006)

Near-bandgap wavelength dependence of long-lived traveling coherent longitudinal acoustic phonons in GaSb-GaAs hererostructures. Miller, JK; Qi, J; Xu, Y; Cho, YJ; Liu, X; Furdyna, JK; Perakis, I; Shahbazyan, TV; Tolk, NH, PHYSICAL REVIEW B, 74, 113313 , (2006)

Spectroscopic infrared near-field microscopy and x-ray reflectivity studies of order and clustering in lipid membranes. Generosi, J; Margaritondo, G; Sandhera, JS; Aggarwal, ID; Tolk, NH; Piston, DW; Castellano, AC; Cricenti, A, APPLIED PHYSICS LETTERS, 89, 233906 , (2006)

Studies of charge carrier trapping and recombination processes in Si/SiO2/MgO structures using second-harmonic generation. White, YV; Lu, X; Pasternak, R; Tolk, NH; Chatterjee, A; Schrimpf, RD; Fleetwood, DM; Ueda, A; Mu, R, APPLIED PHYSICS LETTERS, 88, 062102 , (2006)

Vibrational lifetimes and frequency-gap law of hydrogen bending modes in semiconductors. Sun, B; Shi, GA; Rao, SVSN; Stavola, M; Tolk, NH; Dixit, SK; Feldman, LC; Lupke, G, PHYSICAL REVIEW LETTERS, 96, 035501 , (2006)

Spectroscopic infrared scanning near-field optical microscopy (IR-SNOM). Vobornik, D; Margaritondo, G; Sanghera, JS; Thielen, P; Aggarwal, ID; Ivanov, B; Tolk, NH; Manni, V; Grimaldi, S; Lisi, A; Rieti, S; Piston, DW; Generosi, R; Luce, M; Perfetti, P; Cricenti, A, JOURNAL OF ALLOYS AND COMPOUNDS, 401, 80-85 , (2005)

Characterization of multiple Si/SiO2 interfaces in silicon-on-insulator materials via second-harmonic generation. Jun, B; White, YV; Schrimpf, RD; Fleetwood, DM; Brunier, F; Bresson, N; Cristoloveanu, S; Tolk, NH, APPLIED PHYSICS LETTERS, 85, 3095-3097 , (2004)

Charge trapping in irradiated SOI wafers measured by second harmonic generation. Jun, B; Schrimpf, RD; Fleetwood, DA; White, YV; Pasternak, R; Rashkeev, SN; Brunier, F; Bresson, N; Fouillat, M; Cristoloveanu, S; Tolk, NH, IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 51, 3231-3237 , (2004)

Infrared near-field microscopy with the Vanderbilt free electron laser: overview and perspectives. Vobornik, D; Margaritondo, G; Sanghera, JS; Thielen, P; Aggarwal, ID; Ivanov, B; Miller, JK; Haglund, R; Tolk, NH; Congiu-Castellano, A; Rizzo, MA; Piston, DW; Somma, F; Baldacchini, G; Bonfigli, F; Marolo, T; Flora, F; Montereali, RM; Faenov, A; Pikuz, T; Longo, G; Mussi, V; Generosi, R; Luce, M; Perfetti, P; Cricenti, A, INFRARED PHYSICS & TECHNOLOGY, 45, 409-416 , (2004)

Optical nanospectroscopy applications in material science. Cricenti, A; Longo, G; Ustione, A; Mussi, V; Generosi, R; Luce, M; Rinaldi, M; Perfetti, P; Vobornik, D; Margaritondo, G; Sanghera, JS; Thielen, P; Aggarwal, ID; Ivanov, B; Miller, JK; Haglund, R; Tolk, NH; Congiu-Castellano, A; Rizzo, MA; Piston, DW; Somma, F; Baldacchini, G; Bonfigli, F; Marolo, T; Flora, F; Montereali, RM; Faenov, A; Pikuz, T, APPLIED SURFACE SCIENCE, 234, 374-386 , (2004)

Optical nanospectroscopy study of ion-implanted silicon and biological growth medium. Cricenti, A; Marocchi, V; Generosi, R; Luce, M; Perfetti, P; Vobornik, D; Margaritondo, G; Talley, D; Thielen, P; Sanghera, JS; Aggarwal, ID; Miller, JK; Tolk, NH; Piston, DW, JOURNAL OF ALLOYS AND COMPOUNDS, 362, 21-25 , (2004)

Vibrational lifetimes and isotope effects of interstitial oxygen in silicon and germanium. Sun, B; Yang, Q; Newman, RC; Pajot, B; Tolk, NH; Feldman, LC; Lupke, G, PHYSICAL REVIEW LETTERS, 92, 185503 , (2004)

Vibrational lifetimes of hydrogen and silicon MOSFET reliability. Feldman, LC; Lupke, G; Tolk, NH, GETTERING AND DEFECT ENGINEERING IN SEMICONDUCTOR TECHNOLOGY, 95-96, 123-128 , (2004)

AFM and SNOM characterization of carboxylic acid terminated silicon and silicon nitride surfaces. Cricenti, A; Longo, G; Luce, M; Generosi, R; Perfetti, P; Vobornik, D; Margaritondo, G; Thielen, P; Sanghera, JS; Aggarwal, ID; Miller, JK; Tolk, NH; Piston, DW; Cattaruzza, F; Flamini, A; Prosperi, T; Mezzi, A, SURFACE SCIENCE, 544, 51-57 , (2003)

Band offsets measured by internal photoemission-induced second-harmonic generation. Marka, Z; Pasternak, R; Rashkeev, SN; Jiang, Y; Pantelides, ST; Tolk, NH; Roy, PK; Kozub, J, PHYSICAL REVIEW B, 67, 045302 , (2003)

Carrier relaxation time divergence in single and double layer cuprates. Schneider, ML; Rast, S; Onellion, M; Demsar, J; Taylor, AJ; Glinka, Y; Tolk, NH; Ren, YH; Lupke, G; Klimov, A; Xu, Y; Sobolewski, R; Si, W; Zeng, XH; Soukiassian, A; Xi, XX; Abrecht, M; Ariosa, D; Pavuna, D; Krapf, A; Manzke, R; Printz, JO; Williamsen, MS; Downum, KE; Guptasarma, P; Bozovic, I, EUROPEAN PHYSICAL JOURNAL B, 36, 327-334 , (2003)

Chemically resolved imaging of biological cells and thin films by infrared scanning near-field optical microscopy. Cricenti, A; Generosi, R; Luce, M; Perfetti, P; Margaritondo, G; Talley, D; Sanghera, JS; Aggarwal, ID; Tolk, NH; Congiu-Castellano, A; Rizzo, MA; Piston, DW, BIOPHYSICAL JOURNAL, 85, 2705-2710 , (2003)

Contactless ultra-fast laser probing of radiation-induced leakage current in ultra-thin oxides. Pasternak, R; Chatterjee, A; Shirokaya, YV; Choi, BK; Marka, Z; Miller, JK; Albridge, RG; Rashkeev, SN; Pantelides, ST; Schrimpf, RD; Fleetwood, DM; Tolk, NH, IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 50, 1929-1933 , (2003)

Laser detection of radiation enhanced electron transport in ultra-thin oxides. Pasternak, R; Shirokaya, YV; Marka, Z; Miller, JK; Rashkeev, SN; Pantelides, ST; Tolk, NH; Choi, BK; Schrimpf, RD; Fleetwood, DM, NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 514, 150-155 , (2003)

Particle-solid interactions and 21st century materials science. Feldman, LC; Lupke, G; Tolk, NH; Lopez, R; Haglund, RF; Haynes, TE; Boatner, LA, NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 212, 1-7 , (2003)

Pump-probe second harmonic generation study of ultrafast spin dynamics in semiconductor multilayers. Glinka, YD; Shahbazyan, TV; Perakis, IE; Tolk, NH; Liu, X; Sasaki, Y; Furdyna, JK, SURFACE AND INTERFACE ANALYSIS, 35, 146-150 , (2003)

Spin/carrier dynamics at semiconductor interfaces using intense, tunable, ultra-fast lasers. Jiang, Y; Pasternak, R; Marka, Z; Shirokaya, YV; Miller, JK; Rashkeev, SN; Glinka, YD; Perakis, IE; Roy, PK; Kozub, J; Choi, BK; Fleetwood, DM; Schrimpf, RD; Liu, X; Sasaki, Y; Furdyna, JK; Tolk, NH, PHYSICA STATUS SOLIDI B-BASIC RESEARCH, 240, 490-499 , (2003)

Time-resolved light scattering measurements of cartilage and cornea denaturation due to free electron laser radiation. Sobol, E; Sviridov, A; Kitai, M; Gilligan, JM; Tolk, NH; Edwards, GS, JOURNAL OF BIOMEDICAL OPTICS, 8, 216-222 , (2003)

Two-color optical technique for characterization of x-ray radiation-enhanced electron transport in SiO2. Marka, Z; Pasternak, R; Albridge, RG; Rashkeev, SN; Pantelides, ST; Tolk, NH; Choi, BK; Fleetwood, DM; Schrimpf, RD, JOURNAL OF APPLIED PHYSICS, 93, 1865-1870 , (2003)

Vibrational lifetimes of hydrogen in silicon. Lupke, G; Tolk, NH; Feldman, LC, JOURNAL OF APPLIED PHYSICS, 93, 2317-2336 , (2003)

Fentosecond optical studies of cuprates

. Schneider, ML; Demsar, J; Glinka, YD; Klimov, A; Krapf, A; Rast, S; Ren, YH; Si, W; Xu, Y; Zeng, XH; Bozovic, I; Lupke, G; Manzke, R; Sobolewski, R; Taylor, AJ; Tolk, NH; Xi, XX; Joynt, R; Onellion, M, SUPERCONDUCTING AND RELATED OXIDES: PHYSICS AND NANOENGINEERING ed. by I. Bozovic and D. Pavuna, Proc. SPIE vol. 4811, , , (2002)

Characterization of charge-carrier dynamics in thin oxide layers on silicon by second harmonic generation. Glinka, YD; Wang, W; Singh, SK; Marka, Z; Rashkeev, SN; Shirokaya, Y; Albridge, R; Pantelides, ST; Tolk, NH; Lucovsky, G, PHYSICAL REVIEW B, 65, 193103 , (2002)

Defect transition energies and the density of electronic states in hydrogenated amorphous silicon. Mensing, G; Gilligan, J; Hari, P; Hurt, E; Lupke, G; Pantelides, S; Tolk, N; Taylor, PC, JOURNAL OF NON-CRYSTALLINE SOLIDS, 299, 621-625 , (2002)

Energy Response of an Imaging Plate Exposed to Standard Beta Sources. Gonzalez, AL; Li, H; Mitch, M; Tolk, N; Duggan, DM, APPLIED RADIATION AND ISOTOPES, 57, 875-882 , (2002)

Structure-dependent vibrational lifetimes of hydrogen in silicon. Lupke, G; Zhang, X; Sun, B; Fraser, A; Tolk, NH; Feldman, LC, PHYSICAL REVIEW LETTERS, 88, 135501 , (2002)

Ultrafast carrier relaxation dynamics in single-layer cuprates. Schneider, ML; Demsar, J; Glinka, Y; Klimov, A; Krapf, A; Rast, S; Ren, YH; Si, WD; Xu, Y; Zeng, XH; Bozovic, I; Lupke, G; Manzke, R; Sobolewski, R; Taylor, AT; Tolk, NH; Xi, XX; Joynt, R; Onellion, M, EUROPHYSICS LETTERS, 60, 460-466 , (2002)

Ultrafast dynamics of interfacial electric fields in semiconductor heterostructures monitored by pump-probe second-harmonic generation. Glinka, YD; Shahbazyan, TV; Perakis, IE; Tolk, NH; Liu, X; Sasaki, Y; Furdyna, JK, APPLIED PHYSICS LETTERS, 81, 3717-3719 , (2002)

Ultrafast spin dynamics in GaAs/GaSb/InAs heterostructures probed by second harmonic generation. Glinka, YD; Shahbazyan, TV; Perakis, IE; Tolk, NH; Liu, X; Sasaki, Y; Furdyna, JK, APPLIED PHYSICS LETTERS, 81, 220-222 , (2002)

Very high resolution near-field chemical imaging using an infrared free electron laser. Cricenti, A; Generosi, R; Luce, M; Perfetti, P; Margaritondo, G; Talley, D; Sanghera, JS; Aggarwal, ID; Tolk, NH, PHYSICAL CHEMISTRY CHEMICAL PHYSICS, 4, 2738-2741 , (2002)

Vibrational dynamics of isolated hydrogen in germanium. Cheney, CP; Budde, M; Lupke, G; Feldman, LC; Tolk, NH, PHYSICAL REVIEW B, 65, 035214 , (2002)

Absolute total cross sections for electron-stimulated desorption of hydrogen and deuterium from silicon(111) measured by second harmonic generation. Albert, MM; Tolk, NH, PHYSICAL REVIEW B, 63, 035308 , (2001)

Lifetimes of hydrogen and deuterium related vibrational modes in silicon. Budde, M; Lupke, G; Chen, E; Zhang, X; Tolk, NH; Feldman, LC; Tarhan, E; Ramdas, AK; Stavola, M, PHYSICAL REVIEW LETTERS, 8714, 145501 , (2001)

Size effect in self-trapped exciton photoluminescence from SiO2-based nanoscale materials. Glinka, YD; Lin, SH; Hwang, LP; Chen, YT; Tolk, NH, PHYSICAL REVIEW B, 64, art. no. -085421 , (2001)

Spectroscopic scanning near-field optical microscopy with a free electron laser, CH2 bond imaging in diamond films. Cricenti, A; Generosi, R; Luce, M; Perfetti, P; Margaritondo, G; Talley, D; Sandhera, JS; Aggarwal, ID; Gilligan, JM; Tolk, NH, JOURNAL OF MICROSCOPY-OXFORD, 202, 446-450 , (2001)

Vibrational dynamics of bond-center hydrogen in crystalline silicon. Budde, M; Cheney, CP; Lupke, G; Tolk, NH; Feldman, LC, PHYSICAL REVIEW B, 6319, 195203 , (2001)


Phone: 615-322-2786
Email: norman.tolk@vanderbilt.edu
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