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Short Course in Transmission Electron Microscopy

Short Course in Transmission Electron Microscopy
Presented by Prof. James Wittig

This five lecture series will provide an introduction to Transmission Electron Microscopy (TEM).  These lectures are open to any interested students and faculty.  The topics, times, and tentative dates are listed below.  Reservations are not required and it is not necessary to attend all five lectures.  A complementary textbook for these lectures is the four volume series by Williams and Carter, “Transmission Electron Microscopy”, Plenum Publishing. 

Lecture 1 - The Basics, Tuesday October 16th  4:00 – 5:30 PM
Electron Sources, lenses, apertures, pumps, and holders.  Operational modes of the Philips CM20T.

Lecture 2 – Diffraction, Tuesday October 23rd 4:00 – 5:30 PM
Elastic scattering, Braggs Law, reciprocal lattice and Ewald Sphere, polycrystal and single crystal patterns, Kikuchi diffraction, convergent beam diffraction.

Lecture 3 – Imaging, Tuesday October 30th 4:00 – 5:30 PM
Diffraction contrast, bright field-dark field, defect analysis, phase contrast, high resolution TEM, Z-contrast STEM.

Lecture 4 – Spectroscopy, Tuesday November 6th 4:00 – 5:30 PM
Energy dispersive spectroscopy, electron energy loss spectroscopy, energy filtered imaging, spectrum imaging.

Lecture 5 – Sample Preparation, Tuesday November 13th 4:00 – 5:30 PM
Electropolishing, extraction replicas, ion milling, plan view and cross-section, ultra-microtomy, focused ion beam.

Location - Room 5326 in the Stevenson Center  

 
 
Vanderbilt University