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Hitachi S4200 Field Emission Scanning Electron Microscope
New Wave/Merchantek 213 nm Laser Ablation unit
Perkin Elmer Elan 6100 DRC ICPMS (Inductively Coupled Plasma Mass Spectrometer)
Scintag X-ray diffractometer with furnace and Peltier detector
Thermal Gravimetric Analyzer and Differential Scanning Calorimeter
For more information, please contact
The Vanderbilt Department of Earth and Environmental Sciences - 615.322.2976
.
Copyright © 2002 Vanderbilt University.